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Probing phonon transport dynamics across an interface by electron microscopy
Nature, Published online: 11 June 2025; doi:10.1038/s41586-025-09108-6In situ vibrational electron energy-loss spectroscopy is used to examine phonon transport dynamics across the AlN–SiC interface during thermal transport at sub-nanometre resolution, demonstrating a sharp temperature drop within about 2 nm across the interface.
Nature, Published online: 11 June 2025; doi:10.1038/s41586-025-09108-6In situ vibrational electron energy-loss spectroscopy is used to examine phonon transport dynamics across the AlN–SiC interface during thermal transport at sub-nanometre resolution, demonstrating a sharp temperature drop within about 2 nm across the interface.
